Single event effect proton and heavy ion test results in support of candidate NASA programs
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Single event effect characteristics of CMOS devices employing various epi-layer thicknessesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controllerIEEE Transactions on Nuclear Science, 1995
- SEU hardening of field programmable gate arrays (FPGAs) for space applications and device characterizationIEEE Transactions on Nuclear Science, 1994
- Heavy ion and proton analysis of a GaAs C-HIGFET SRAMIEEE Transactions on Nuclear Science, 1993