Measurements of Microwave Conductivity and Dielectric Constant by the Cavity Perturbation Method and Their Errors
- 1 June 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 33 (6) , 519-526
- https://doi.org/10.1109/tmtt.1985.1133108
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Microwave Measurement of Conductivity and Permittivity of Semiconductor Spheres by Cavity Perturbation TechniqueIEEE Transactions on Microwave Theory and Techniques, 1981
- High-Accuracy Wide-Range Measurement Method for Determination of Complex Permittivity in Reentrant Cavity: Part A --- Theoretical Analysis of the MethodIEEE Transactions on Microwave Theory and Techniques, 1980
- Conductivity of α-silver iodide in the microwave rangeThe Journal of Chemical Physics, 1980
- New cavity perturbation technique for microwave measurement of dielectric constantReview of Scientific Instruments, 1979
- A Cavity Perturbation Method for Routine Permittivity Measurement*Journal of Microwave Power, 1973
- Cavity Perturbation Techniques for Measurement of the Microwave Conductivity and Dielectric Constant of a Bulk Semiconductor MaterialIEEE Transactions on Microwave Theory and Techniques, 1972
- New Approach to the Perturbation of Cavity Resonators by Homogeneous, Isotropic SpheresJournal of Applied Physics, 1965
- The Measurement of Conductivity and Permittivity of Semiconductor Spheres by an Extension of the Cavity Perturbation MethodIEEE Transactions on Microwave Theory and Techniques, 1961
- Perturbation theory of resonant cavitiesProceedings of the IEE Part C: Monographs, 1960
- A microwave resonant cavity method for measuring the resistivity of semi-conducting materialsBritish Journal of Applied Physics, 1956