Electrical Characteristics of Metal/Cerium Dioxide/Silicon Structures

This publication has 16 references indexed in Scilit:

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  Japanese Journal of Applied Physics, 1994
• Characterization of Epitaxially Grown CeO₂(110) Layers on Si by Means of Shadowing Pattern Imaging with Fast Ion Beams
  Japanese Journal of Applied Physics, 1994
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• RBS/Channeling Study of the Crystallographic Correlation for Epitaxial CeO₂ on Si
  Japanese Journal of Applied Physics, 1993
• Intermediate Amorphous Layer Formation Mechanism at the Interface of Epitaxial CeO₂ Layers and Si Substrates
  Japanese Journal of Applied Physics, 1993
• Structural and Electrical Properties of Ta₂O₅ Grown by the Plasma-Enhanced Liquid Source CVD Using Penta Ethoxy Tantalum Source
  Japanese Journal of Applied Physics, 1993
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• Influence of Reactive Gas Pressure on the Properties of Thin Film Ta₂O₅
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• A two-stage monolithic IF amplifier utilizing a Ta₂O₅capacitor
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