Waveform measurements on gigahertz semiconductor devices by scanning electron microscope stroboscopy
- 1 July 1981
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 39 (1) , 81-82
- https://doi.org/10.1063/1.92524
Abstract
Waveform measurements on the semiconductor devices with the stroboscopic scanning electron microscope are reported, for the first time, in the gigahertz region. Waveforms of the high-field domains in a Gunn-effect diode triggered at 1 GHz are clearly measured with a time resolution of 5 ps.Keywords
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