Dynamics of Phasons; Phase Defects Formed on Dimer Rows, and Related Structural Changes of the Si(100) Surface at 80 K Studied by Scanning Tunneling Microscopy

Publisher Website
Google Scholar
Abstract
Type-P defects, which are mobile phase defects on dimer rows with a structure similar to that of the type-C defect, were observed on Si(100) surface at 80 K, however, the observed surface structure was mainly c(4×2), contrary to the previous results obtained at 6 K. Complete p(2×2) arrangement was unstable, and type-P defects tended to form pairs with other type-P defects on neighboring dimer rows, resulting in a reduction of the area with complete p(2×2) arrangement. This is the first observation of the interacting phasons; type-P defects formed on Si(100) surface. The observed results were analyzed with the Ising model, and domain boundaries between c(4×2) and p(2×2) arrangements were found to play an important role in the dynamics of type-P defects at 80 K.