Temperature dependence of Fowler-Nordheim injection from accumulated n-type silicon into silicon dioxide
- 1 May 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 40 (5) , 1017-1019
- https://doi.org/10.1109/16.210213
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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