The use of x-ray interferometry to investigate the linearity of the NPL Differential Plane Mirror Optical Interferometer
- 13 July 2000
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 11 (8) , 1126-1130
- https://doi.org/10.1088/0957-0233/11/8/305
Abstract
No abstract availableKeywords
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