Oxide reliability criterion for the evaluation of the endurance performance of electrically erasable programmable read only memories
- 1 May 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 71 (9) , 4589-4593
- https://doi.org/10.1063/1.350758
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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