Spectroscopy of excitons bound to isoelectronic defect complexes in silicon
- 31 March 1985
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 53 (12) , 1055-1060
- https://doi.org/10.1016/0038-1098(85)90880-4
Abstract
No abstract availableKeywords
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