Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM
- 1 June 1997
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 67 (1-4) , 59-68
- https://doi.org/10.1016/s0304-3991(97)00003-x
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- A microtexture study of eutectic carbides in white cast irons using electron back-scatter diffractionJournal of Materials Science, 1993
- The measurement of local plastic deformation in a metal‐matrix composite by electron back‐scatter patternsJournal of Microscopy, 1993
- Orientation imaging microscopy: Application to the study of cube recrystallization texture in aluminumScripta Metallurgica et Materialia, 1992
- Automatic analysis of electron backscatter diffraction patternsMetallurgical Transactions A, 1992
- Microtexture determination by electron back-scatter diffractionJournal of Materials Science, 1992
- Deformation studies of metal matrix composites using electron backscatter patternsMaterials Science and Engineering: A, 1991
- Observations of deformation and fracture heterogeneities in a nickel-base superalloy using electron back scattering patternsActa Metallurgica, 1988
- Accurate microcrystallography at high spatial resolution using electron back-scattering patterns in a field emission gun scanning electron microscopeJournal of Physics E: Scientific Instruments, 1981
- Accurate microcrystallography using electron back-scattering patternsPhilosophical Magazine, 1977
- Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscopePhilosophical Magazine, 1973