Electromigration failure in a finite conductor with a single blocking boundary
- 1 December 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 76 (11) , 7305-7310
- https://doi.org/10.1063/1.358018
Abstract
The (one-dimensional) electromigration boundary-value problem is considered for the case of a single blocking boundary with a constant vacancy supply at the other boundary. Using the drift/diffusion model expressed by the Fokker–Planck equation, we find that the saturation time (tsat) increases exponentially with current density (j) and not as j−2, as has been suggested. However, it is not the saturation time which determines the lifetime (tbd); it is the time to reach some critical vacancy concentration (c*). In agreement with experimental results and numerical calculations, we find that tbd∼j−2. We also find that tbd∼c*.This publication has 10 references indexed in Scilit:
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