Vacancy supersaturation model for electromigration failure under dc and pulsed dc stress
- 1 May 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 71 (9) , 4264-4268
- https://doi.org/10.1063/1.350807
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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