On the relationship between the conduction characteristics and the statistical parameters of a normal distribution of filamentary resistances in an electroformed metal/insulator/metal device
- 1 August 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 141 (2) , 201-214
- https://doi.org/10.1016/0040-6090(86)90348-2
Abstract
No abstract availableKeywords
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