Electromigration, Stresses, and Pulse Effects in Thin-Film Conductors Model
- 16 January 1990
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 117 (1) , 177-190
- https://doi.org/10.1002/pssa.2211170119
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Electromigration in thin aluminum films on titanium nitrideJournal of Applied Physics, 1976