X-ray photoelectron spectroscopic study of room-temperature evolution of oxide-covered hydrogenated amorphous silicon/aluminium interface
- 1 May 1995
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 89 (1) , 57-61
- https://doi.org/10.1016/0169-4332(95)00008-9
Abstract
No abstract availableKeywords
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