Optical characterization of silicon dioxide layers grown on silicon under different growth conditions
- 1 February 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 313-314, 292-297
- https://doi.org/10.1016/s0040-6090(97)00835-3
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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