Resistance Calculation from Mask Artwork Data by Finite Element Method

This publication has 9 references indexed in Scilit:

• Resistance Extraction from Mask Layout Data
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1983
• A Layout Verification System for Analog Bipolar Integrated Circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1983
• Symbolic Parasitic Extractor for Circuit Simulation (SPECS)
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1983
• Potential Distribution and Multi-Terminal DC Resistance Computations for LSI Technology
  IBM Journal of Research and Development, 1979
• A boundary technique for calculation of distributed resistance
  IEEE Transactions on Electron Devices, 1970
• Messung des übergangswiderstandes zwischen metall und diffusionsschicht in Si-planarelementen
  Solid-State Electronics, 1969
• Resistance calculations for thin film patterns
  Thin Solid Films, 1968
• Computation of Impedance and Attenuation of TEM-Lines by Finite Difference Methods
  IEEE Transactions on Microwave Theory and Techniques, 1965
• The Numerical Solution of Some Important Transmission-Line Problems
  IEEE Transactions on Microwave Theory and Techniques, 1965