The S-Algorithm: A Promising Solution for Systematic Functional Test Generation
- 1 July 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 4 (3) , 250-263
- https://doi.org/10.1109/tcad.1985.1270121
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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