Test Generation Techniques
- 1 March 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Computer
- Vol. 13 (3) , 9-15
- https://doi.org/10.1109/mc.1980.1653524
Abstract
Existing test generation procedures are rooted in the SSI/MSI era. New techniques will cope with today's vastly more complicated LSI/VLSI systems.Keywords
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