Broadband spectroscopic ellipsometry based on a Fourier transform spectrometer
- 1 October 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 234 (1-2) , 352-355
- https://doi.org/10.1016/0040-6090(93)90284-v
Abstract
No abstract availableFunding Information
- Bundesministerium für Forschung und Technologie (0329029A)
This publication has 5 references indexed in Scilit:
- Determination of the refractive index of metal/ceramic composites and their components by spectroscopic ellipsometry and effective medium theoriesThin Solid Films, 1993
- Infrared ellipsometer for the study of surfaces, thin films, and superlatticesApplied Optics, 1992
- Transmission Properties of Grid PolarizersApplied Optics, 1973
- Parameter-Correlation and Computational Considerations in Multiple-Angle Ellipsometry*Journal of the Optical Society of America, 1971
- Definitions and conventions in ellipsometrySurface Science, 1969