Predicted propagation delay of Si/SiGe heterojunction bipolar ECL circuits
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 25 (5) , 1268-1276
- https://doi.org/10.1109/4.62151
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Accurate analytical delay expressions for ECL and CML circuits and their applications to optimizing high-speed bipolar circuitsIEEE Journal of Solid-State Circuits, 1990
- A 20-ps Si bipolar IC using advanced super self-aligned process technology with collector ion implantationIEEE Transactions on Electron Devices, 1989
- Si/Si/sub 1-x/Ge/sub x/ heterojunction bipolar transistors produced by limited reaction processingIEEE Electron Device Letters, 1989
- High-speed performance of Si/Si/sub 1-x/Ge/sub x/ heterojunction bipolar transistorsIEEE Electron Device Letters, 1989
- 10.7 GHz frequency divider using double layer silicon bipolar process technologyElectronics Letters, 1988
- A propagation-delay expression and its application to the optimization of polysilicon emitter ECL processesIEEE Journal of Solid-State Circuits, 1988
- Study of delay times contributing to the ftof bipolar transistorsIEEE Electron Device Letters, 1986
- Measurement of electron lifetime, electron mobility and band-gap narrowing in heavily doped p-type siliconPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1986
- Simultaneous measurement of hole lifetime, hole mobility and bandgap narrowing in heavily doped n-type siliconPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1985
- Prospects of SST technology for high speed LSIPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1985