Study of In diffusion into ZnSe buffer-layer material of chalcopyrite solar cells with rough surfaces by means of ERDA measurements
- 1 April 2002
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 188 (1-4) , 55-60
- https://doi.org/10.1016/s0168-583x(01)01009-6
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Rutherford backscattering analysis of thin films and superlattices with roughnessJournal of Physics D: Applied Physics, 2001
- Effects of surface roughness on results in elastic recoil detection measurementsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2000
- ZnSe thin films grown by chemical vapour deposition for application as buffer layer in CIGSS solar cellsThin Solid Films, 2000
- Cu(In,Ga)Se2 solar cells with a ZnSe buffer layer: interface characterization by quantum efficiency measurementsProgress In Photovoltaics, 1999
- Effect of surface topography on scanning RBS microbeam measurementsVacuum, 1998
- Simulation of surface roughness effects in ERDANuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1998
- The Berlin time-of-flight ERDA setupeNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1998
- Influence of surface roughness on measuring depth profiles and the total amount of implanted ions by RBS and ERDANuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1998
- Status and prospects for CIS-based photovoltaicsSolar Energy Materials and Solar Cells, 1997
- Cathodoluminescence Study on Diffusion Coefficients of Al, Ga and In in ZnSeJapanese Journal of Applied Physics, 1986