Lithium Ion Backscattering as a Novel Tool for the Characterization of Oxidized Phases of Aluminum Obtained from Industrial Anodization Procedures
- 1 January 1976
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- A NEW utilization of11B ion beams: Hydrogen analysis by1H11B,α)α α nuclear reactionRadiation Effects, 1974
- Comparison of back-scattering parameters using high energy oxygen and helium ionsThin Solid Films, 1973
- Depth profiles of aluminum and sodium near surfaces: Nuclear resonance methodThin Solid Films, 1973
- Nuclear microanalysis using MeV carbon ion backscattering; usefulness and applicationsJournal of Radioanalytical and Nuclear Chemistry, 1973
- Complementary use of microanalysis by the direct observation of nuclear reactions and of backscattering induced by charged particlesJournal of Radioanalytical and Nuclear Chemistry, 1973
- Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de GraaffNuclear Instruments and Methods, 1971
- Evaluation of Silicon Nitride Layers of Various Composition by Backscattering and Channeling-Effect MeasurementsJournal of Applied Physics, 1971
- Analysis of amorphous layers on silicon by backscattering and channeling effect measurementsSurface Science, 1970
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970
- Critical angles for channeling of low energy ions in tungstenCanadian Journal of Physics, 1968