Acoustic microscopy of materials and surface layers
- 1 May 1984
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 55 (9) , 3261-3275
- https://doi.org/10.1063/1.333384
Abstract
The application of pulsed reflection acoustic microscopy to the characterization of bulk materials and thin layers of various materials on surfaces is illustrated. The factors that contribute to sharp image contrast, edge definition, and image reversal are delineated and illustrated. Acoustic material signatures of a variety of bulk materials and thin layers of materials on surfaces of a different material are shown. The origin and nature of acoustic material signatures is discussed.This publication has 24 references indexed in Scilit:
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