Diffusion of Point Defects in Silicon Crystals during Melt-Growth. II -One Diffusor Model-
- 1 April 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (4R) , 1747-1753
- https://doi.org/10.1143/jjap.32.1747
Abstract
We introduce the phenomenological equations which describe the diffusion of one species of point defects in silicon single crystals during melt-growth. The chemical potential of point defects frozen into the crystal during CZ crystal growth is estimated, and the formation mechanism of the OSF-ring in CZ crystal is discussed with the equations thus developed. It was shown that the phenomenological diffusion equations can explain well the dependence of the location of the OSF-ring in CZ-crystals on crystal growth rate, and disappearance of the OSF-ring at low growth rate. The OSF-ring is proposed to be generated at the peak of the chemical potential of point defects frozen into the crystal.Keywords
This publication has 5 references indexed in Scilit:
- Diffusion of Point Defects in Silicon Crystals during Melt-Growth. I -Uphill Diffusion-Japanese Journal of Applied Physics, 1993
- Diffusion of Point Defects in Silicon Crystals during Melt-Growth. III -Two Diffusor Model-Japanese Journal of Applied Physics, 1993
- Application of Copper-Decoration Method to Characterize As-Grown Czochralski-SiliconJapanese Journal of Applied Physics, 1992
- Minimization of thermoelastic stresses in Czochralski grown silicon: application of the integrated system modelJournal of Crystal Growth, 1991
- Swirl defects in float-zoned silicon crystalsPhysica B+C, 1983