Comparison of MOS capacitor and transistor postirradiation response
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 1792-1799
- https://doi.org/10.1109/23.45371
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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