A unified negative-binomial distribution for yield analysis of defect-tolerant circuits
- 1 June 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 42 (6) , 724-734
- https://doi.org/10.1109/12.277291
Abstract
It has been recognized that the yield of fault-tolerant VLSI circuits depends on the size of the fault clusters. Consequently, models for yield analysis have been proposed for large-area clustering and small-area clustering, based on the two-parameter negative-binomial distribution. The addition of a new parameter, the block size, to the two existing parameters of the fault distribution is proposed. This parameter allows the unification of the existing models and, at the same time, adds a whole range of medium-size clustering models. Thus, the flexibility in choosing the appropriate yield model is increased. Methods for estimating the newly defined block size are presented and the approach is validated through simulation and empirical data.<>Keywords
This publication has 8 references indexed in Scilit:
- The use and evaluation of yield models in integrated circuit manufacturingIEEE Transactions on Semiconductor Manufacturing, 1990
- A Unified Approach to Yield Analysis of Defect Tolerant CircuitsPublished by Springer Nature ,1990
- Modeling defect spatial distributionIEEE Transactions on Computers, 1989
- Small-area fault clusters and fault tolerance in VLSI circuitsIBM Journal of Research and Development, 1989
- Defect and Fault Tolerance in VLSI SystemsPublished by Springer Nature ,1989
- Correlation analysis of particle clusters on integrated circuit wafersIBM Journal of Research and Development, 1987
- Estimating variation in IC yield estimatesIEEE Journal of Solid-State Circuits, 1986
- Fault clustering: modeling and observation on experimental LSI chipsIEEE Journal of Solid-State Circuits, 1975