A new method for thin-film thickness measurement using PIXE
- 1 September 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 43 (2) , 203-209
- https://doi.org/10.1016/0168-583x(89)90039-6
Abstract
No abstract availableKeywords
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