Empty states investigation of Ni2Si by photon absorption spectroscopy
- 1 July 1987
- journal article
- Published by IOP Publishing in Physica Scripta
- Vol. 36 (1) , 153-155
- https://doi.org/10.1088/0031-8949/36/1/025
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- absorption edges inSiPhysical Review B, 1986
- PrefaceSurface Science, 1986
- Local structure determination of the CoSi(111) interface by surface electron energy-loss fine-structure techniqueSurface Science, 1986
- Pd 2 Si: Unoccupied One-Particle States and White Line in L 2,3 -Edge Absorption SpectraEurophysics Letters, 1986
- Momentum-resolved inverse photoemissionSurface Science Reports, 1985
- Electronic properties on silicon-transition metal interface compoundsSurface Science Reports, 1985
- Ion-beam-induced modification of Ni silicides investigated by Auger-electron spectroscopyPhysical Review B, 1983
- Microscopic properties and behavior of silicide interfacesSurface Science, 1983
- Els investigation of the Si-Pd interfaceSurface Science, 1982
- X-ray absorption spectra: K-edges of 3d transition metals, L-edges of 3d and 4d metals, and M-edges of palladiumSolid State Communications, 1982