Characterization of the grown-in defects in Zn-doped InP
- 31 July 1984
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 51 (1) , 15-18
- https://doi.org/10.1016/0038-1098(84)90761-0
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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