Effect of Zr/Ti Ratios on Characterization of Pb(Zr[sub x]Ti[sub 1−x])O[sub 3] Thin Films on Al[sub 2]O[sub 3] Buffered Si for One-Transistor Memory Applications
Open Access
- 1 January 2003
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 150 (3) , G187
- https://doi.org/10.1149/1.1542901
Abstract
No abstract availableKeywords
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