Integrated circuit quality optimization using surface integrals
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 12 (12) , 1868-1879
- https://doi.org/10.1109/43.251150
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Orthogonal array approach to gradient based yield optimizationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Accurate and efficient evaluation of circuit yield and yield gradientsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- OPTIMIZATION OF PARAMETRIC YIELD: A TUTORIALInternational Journal of High Speed Electronics and Systems, 1992
- Sensitivity computation in piecewise approximate circuit simulationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1991
- A macromodeling based approach for efficient IC yield optimizationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1991
- Parametric yield optimization for MOS circuit blocksIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Efficient optimization with integrated gradient approximationsIEEE Transactions on Microwave Theory and Techniques, 1988
- Generalization of Yield Optimization Problem: Maximum Income ApproachIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
- Statistical modeling for efficient parametric yield estimation of MOS VLSI circuitsIEEE Transactions on Electron Devices, 1985
- A Class of Methods for Solving Nonlinear Simultaneous EquationsMathematics of Computation, 1965