Lifetime measurements on long-lived levels of confined highly charged ions
- 21 June 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 70 (25) , 3860-3863
- https://doi.org/10.1103/physrevlett.70.3860
Abstract
A technique based on the injection of highly charged ions from new low-energy ion sources into a Kingdon ion trap has been used to measure millisecond or longer lifetimes τ of metastable levels in ground terms of the ions. The technique has been initially applied to ions of argon, with the results τ(,2 )=14.8(1.1) ms, τ(,2 )=8.53(0.24) ms, and τ(,3 )=159.7(9.7) ms.
Keywords
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