Spin-polarized secondary electrons from a scanning tunneling microscope in field emission mode
- 6 February 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 54 (6) , 587-589
- https://doi.org/10.1063/1.100887
Abstract
A new technique has been developed which opens the way to magnetic imaging with nm resolution. A narrow electron beam produced with a scanning tunneling microscope operating in field emission mode impinges on the magnetic surface, and the spin polarization of the emitted secondary electrons is monitored. As a first result, a hysteresis loop from an Fe-based metallic glass shows that the low-energy secondary electrons excited with this technique are spin polarized.Keywords
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