Scanning tunneling microscopy: a surface science tool and beyond
- 1 January 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 299-300, 956-964
- https://doi.org/10.1016/0039-6028(94)90709-9
Abstract
No abstract availableThis publication has 44 references indexed in Scilit:
- Deformation-Free Topography from Combined Scanning Force and Tunnelling ExperimentsEurophysics Letters, 1993
- True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive ForcesScience, 1993
- Limits and Possibilities of MiniaturizationJapanese Journal of Applied Physics, 1993
- Mechanical detection of magnetic resonanceNature, 1992
- Observation of single charge carriers by force microscopyPhysical Review Letters, 1990
- Understanding magnetic force microscopyZeitschrift für Physik B Condensed Matter, 1990
- Contact electrification using force microscopyPhysical Review Letters, 1989
- Nonlinear alternating-current tunneling microscopyPhysical Review Letters, 1989
- Images of crystalline alkanes obtained with scanning tunneling microscopyZeitschrift für Physik B Condensed Matter, 1989
- The generation of laser difference frequencies using the scanning tunneling microscopeIEEE Transactions on Instrumentation and Measurement, 1989