Direct observation of lattice defects in silicon by means of transmission electron microscopy
- 1 August 1962
- journal article
- Published by Springer Nature in Il Nuovo Cimento (1869-1876)
- Vol. 25 (4) , 931-938
- https://doi.org/10.1007/bf02733159
Abstract
No abstract availableKeywords
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- Effect of Structural Defects in Germanium on the Diffusion and Acceptor Behavior of CopperJournal of Applied Physics, 1957
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