A scanning force microscope with a fiber-optic-interferometer displacement sensor
- 1 May 1991
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 62 (5) , 1280-1284
- https://doi.org/10.1063/1.1142485
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Fiber optic displacement sensor with subangstrom resolutionApplied Optics, 1990
- Improved fiber-optic interferometer for atomic force microscopyApplied Physics Letters, 1989
- Imaging Crystals, Polymers, and Processes in Water with the Atomic Force MicroscopeScience, 1989
- Force microscope using a fiber-optic displacement sensorReview of Scientific Instruments, 1988
- Scanning Tunneling Microscopy and Atomic Force Microscopy: Application to Biology and TechnologyScience, 1988
- Scanning tunneling microscopy imaging of biological structuresJournal of Vacuum Science & Technology A, 1988
- High-stability bimorph scanning tunneling microscopeReview of Scientific Instruments, 1987
- Scanning tunneling microscope with micrometer approach and thermal compensationReview of Scientific Instruments, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Fiber-optic interferometer for remote subangstrom vibration measurementReview of Scientific Instruments, 1984