Transmission and reflection electron microscopy of electromigration phenomena
- 31 January 1994
- journal article
- review article
- Published by Elsevier in Materials Chemistry and Physics
- Vol. 36 (3-4) , 199-216
- https://doi.org/10.1016/0254-0584(94)90031-0
Abstract
No abstract availableThis publication has 80 references indexed in Scilit:
- Hetero-electromigration on semiconductor surfacesSurface Science, 1991
- Observation of electromigration effect upon Si-MBE growth on Si(001) surfaceVacuum, 1990
- Surface electromigration of metal atoms on Si(111) surfaces studied by UHV reflection electron microscopyUltramicroscopy, 1989
- Electronic structure of the single-domain Si(001)21-K surfacePhysical Review B, 1989
- Field-induced surface transport of indium adatoms on Si(111) surfacesThin Solid Films, 1982
- Activation energies for the different electromigration mechanisms in aluminumSolid-State Electronics, 1981
- TEM in-situ observation of electromigration damage in Al-Cu strips I. Constant DC stressingPhysica Status Solidi (a), 1981
- Electromigration in Al Films Containing SiApplied Physics Letters, 1971
- Electromigration in Thin Al FilmsJournal of Applied Physics, 1969
- DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMSApplied Physics Letters, 1967