Observation of electromigration effect upon Si-MBE growth on Si(001) surface

This publication has 13 references indexed in Scilit:

• Crystallographic analysis and observation of surface micro-areas using microprobe reflection high-energy electron diffraction
  Materials Science Reports, 1989
• REM Observation on Conversion between Single-Domain Surfaces of Si(001) 2×1 and 1×2 Induced by Specimen Heating Current
  Japanese Journal of Applied Physics, 1989
• Transformations on clean Si(111) stepped surface during sublimation
  Surface Science, 1989
• Electronic structure of the single-domain Si(001)21-K surface
  Physical Review B, 1989
• Microscopic observation of Si MBE on Si(001) surface using microprobe RHEED
  Journal of Crystal Growth, 1989
• Si(100) Surface under an Externally Applied Stress
  Physical Review Letters, 1988
• Stabilities of single-layer and bilayer steps on Si(001) surfaces
  Physical Review Letters, 1987
• On the evaporation rate of silicon
  Surface Science, 1986
• Growth kinetics of Si-molecular beam epitaxy
  Applied Physics A, 1982
• The growth of crystals and the equilibrium structure of their surfaces
  Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1951