Effects of H2/NH3 flow-rate ratio on the luminescent, structural, and electrical properties of GaN epitaxial layers grown by MOCVD
- 1 October 1999
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 28 (10) , 1096-1100
- https://doi.org/10.1007/s11664-999-0244-2
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Optimization of the MOVPE growth of GaN on sapphireMaterials Science and Engineering: B, 1997
- Eurotour' 96 — The wide bandgap special Rigi-Strasbourg-CardiffIII-Vs Review, 1996
- Ion-implanted GaN junction field effect transistorApplied Physics Letters, 1996
- The role of the low temperature buffer layer and layer thickness in the optimization of OMVPE growth of GaN on sapphireJournal of Electronic Materials, 1995
- Microwave performance of a 0.25 μm gate AlGaN/GaN heterostructure field effect transistorApplied Physics Letters, 1994
- High quality AlxGa1−xN grown by metalorganic chemical vapor deposition using trimethylamine alane as the aluminum precursorApplied Physics Letters, 1994
- Intensity dependence of photoluminescence in GaN thin filmsApplied Physics Letters, 1994
- P-GaN/N-InGaN/N-GaN Double-Heterostructure Blue-Light-Emitting DiodesJapanese Journal of Applied Physics, 1993
- Properties of Gallium NitrideMRS Proceedings, 1987
- Mechanism of Yellow Luminescence in GaNJapanese Journal of Applied Physics, 1980