Titanium disilicide nanostructures: two phases and their surfaces
- 1 July 1999
- journal article
- Published by Elsevier in Surface Science
- Vol. 431 (1-3) , 116-127
- https://doi.org/10.1016/s0039-6028(99)00434-3
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- STM experiment and atomistic modelling hand in hand: individual molecules on semiconductor surfacesSurface Science Reports, 1999
- Correlation of morphology and electrical properties of nanoscale TiSi2 epitaxial islands on Si (001)Thin Solid Films, 1997
- Dependence of the C49–C54 TiSi2 phase transition temperature on film thickness and Si substrate orientationThin Solid Films, 1997
- Theoretical study of Ti adsorption on Si(001) surfacesPhysical Review B, 1995
- In situ x-ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow linesApplied Physics Letters, 1995
- Reactive adsorption and diffusion of Ti on Si(001) by scanning tunneling microscopyPhysical Review B, 1995
- Kinetic mechanisms of theC49-to-C54 polymorphic transformation in titanium disilicide thin films: A microstructure-scaled nucleation-mode transitionPhysical Review B, 1994
- Atomic scale study of local TiSi2/Si epitaxiesJournal of Applied Physics, 1990
- Polytype formation in zirconium-silicon thin filmsJournal of Applied Physics, 1990
- Thermal expansion studies of the group IV-VII transition-metal disilicidesJournal of Applied Physics, 1988