Rapid evaluation of C-V plots for MOS structures

This publication has 11 references indexed in Scilit:

• MOS STUDY OF INTERFACE-STATE TIME CONSTANT DISPERSION
  Applied Physics Letters, 1967
• Thin-film silicon-on-sapphire deep depletion MOS transistors
  IEEE Transactions on Electron Devices, 1966
• FREQUENCY DEPENDENCE OF THE IMPEDANCE OF DISTRIBUTED SURFACE STATES IN MOS STRUCTURES
  Applied Physics Letters, 1966
• MOS CONDUCTANCE TECHNIQUE FOR MEASURING SURFACE STATE PARAMETERS
  Applied Physics Letters, 1965
• Physical limitations on the frequency response of a semiconductor surface inversion layer
  Solid-State Electronics, 1965
• Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures
  Solid-State Electronics, 1965
• Impedance of semiconductor-insulator-metal capacitors
  Solid-State Electronics, 1964
• Field Effect‐Capacitance Analysis of Surface States on Silicon
  Physica Status Solidi (b), 1963
• An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes
  Solid-State Electronics, 1962
• Electrical Properties of Silicon Containing Arsenic and Boron
  Physical Review B, 1954