High level test generation using data flow descriptions
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 480-484
- https://doi.org/10.1109/edac.1990.136695
Abstract
To significantly expedite the test generation process for sequential VLSI circuits, the hierarchy in the circuit descriptions should be exploited. Conventional test generators can provide tests for relatively small modules, which are typically embedded in large circuits. This paper considers test generation for complex VLSI circuits composed of many interconnected modules. In contrast to the previous approaches, the authors use high-level primitives and data flow descriptions to perform hierarchical test generation. Data flow descriptions provide the set of valid control signals to be activated for a particular data path to be active. Sequential propagation and justification of signals is carried out recursively. Results are presented based on an implementation of the algorithm in LISP on a Texas Instruments Explorer.<>Keywords
This publication has 12 references indexed in Scilit:
- Combinational profiles of sequential benchmark circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- The KARL/KARATE system-automatic test pattern generation based on RT level descriptionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A unified design representation can workPublished by Association for Computing Machinery (ACM) ,1989
- A novel approach to accurate timing verification using RTL descriptionsPublished by Association for Computing Machinery (ACM) ,1989
- Test Schedules for VLSI Circuits Having Built-In Test HardwareIEEE Transactions on Computers, 1986
- Functional Testing of MicroprocessorsIEEE Transactions on Computers, 1984
- Hitest: A Knowledge-Based Test Generation SystemIEEE Design & Test of Computers, 1984
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- Test Generation for MicroprocessorsIEEE Transactions on Computers, 1980
- Diagnosis & Reliable Design of Digital SystemsPublished by Springer Nature ,1976