Determination of surface recombination velocity at a grain boundary using electron-beam-induced current
- 1 January 1983
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 54 (1) , 169-173
- https://doi.org/10.1063/1.331726
Abstract
In order to determine the surface recombination velocity at a grain boundary surface, computer-aided calculations of the theoretical electron-beam-induced-current response to a point source excitation are fitted to data taken as a function of distance from the grain boundary. It is demonstrated that the data is in good agreement with this theoretical response for distances greater than two maximum penetration depths of the incident electron beam.This publication has 6 references indexed in Scilit:
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