A current testing for CMOS static RAMs
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 137-142
- https://doi.org/10.1109/mt.1993.263135
Abstract
No abstract availableKeywords
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- QUIETEST: a quiescent current testing methodology for detecting leakage faultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
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