Carrier cooling in undoped and modulation-dopedAs multiple quantum wells
- 15 August 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 36 (5) , 2954-2957
- https://doi.org/10.1103/physrevb.36.2954
Abstract
Carrier cooling, as observed by time-resolved photoluminescence, is completely different for undoped and -type modulation-doped As/ As multiple-quantum-well structures. Fast cooling by carrier-LO-phonon scattering is observed for the undoped quantum wells at low excitation and is well described using the theoretical three-dimensional carrier-LO-phonon scattering time. Cooling in the -type modulation-doped sample, however, is reduced by a factor of 35 for the same excitation densities. Our comparative study shows that the reduced energy-loss rate is not caused by the reduced dimensionality of the carrier system, but is an effect of the high electron density.
Keywords
This publication has 10 references indexed in Scilit:
- Cooling of an electron-hole plasma in aGa0.47In0.53As multiple-quantum-well structurePhysical Review B, 1987
- Hot carrier-phonon interaction in three- and two-dimensional Ga0.47In0.53AsSolid State Communications, 1987
- Dependence of electron temperature on well width in the Al0.48In0.52As/Ga0.47In0.53As single-quantum wellIEEE Journal of Quantum Electronics, 1986
- Picosecond luminescence measurements of hot carrier relaxation in III–V semiconductors using sum frequency generationPhysica B+C, 1985
- Hot-Electron Relaxation in GaAs Quantum WellsPhysical Review Letters, 1985
- Energy-Loss Rates for Hot Electrons and Holes in GaAs Quantum WellsPhysical Review Letters, 1985
- Recombination-induced heating of free carriers in a semiconductorPhysical Review B, 1985
- Time-Resolved Photoluminescence of Two-Dimensional Hot Carriers in GaAs-AlGaAs HeterostructuresPhysical Review Letters, 1984
- Evidence of the importance of Auger recombination for InGaAsP lasersElectronics Letters, 1984
- Photoexcited carrier lifetime and Auger recombination in 1.3-μm InGaAsPApplied Physics Letters, 1983