SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor

This publication has 13 references indexed in Scilit:

• Implementing QML for radiation hardness assurance
  IEEE Transactions on Nuclear Science, 1990
• SEU characterization and design dependence of the SA3300 microprocessor
  IEEE Transactions on Nuclear Science, 1990
• An SEU-hardened CMOS data latch design
  IEEE Transactions on Nuclear Science, 1988
• Scaling studies of CMOS SRAM soft-error tolerances—From 16K to 256K
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1987
• Revised Funnel Calculations for Heavy Particles with High dE/dx
  IEEE Transactions on Nuclear Science, 1986
• Mechanisms Leading to Single Event Upset
  IEEE Transactions on Nuclear Science, 1986
• Memory SEU simulations using 2-D transport calculations
  IEEE Electron Device Letters, 1985
• Simulation Approach for Modeling Single Event Upsets on Advanced CMOS SRAMS
  IEEE Transactions on Nuclear Science, 1985
• Comparison of Analytical Models and Experimental Results for Single Event Upset in CMOS SRAMs
  IEEE Transactions on Nuclear Science, 1983
• Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMs
  IEEE Transactions on Nuclear Science, 1982