Structure analysis of ZnTe-ZnSe strained-layer superlattices by transmission electron microscopy observation
- 15 August 1990
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 68 (4) , 1606-1609
- https://doi.org/10.1063/1.346639
Abstract
Structural properties of ZnTe-ZnSe strained-layer superlattices grown on GaAs(001) substrates by hot wall epitaxy were investigated by transmission electron microscopy. The satellite spots observed in transmission electron diffraction patterns confirmed the superlattice periodicity and agreed very well with the results from x-ray diffraction. Smooth and abrupt interfaces are observed in (110) cross-sectional images. Strain information obtained from the transmission electron diffraction and lattice images indicates that coherent strain has not been achieved in ZnTe-ZnSe superlattices when the layer thickness of each constituent material exceeded 13 Å.This publication has 11 references indexed in Scilit:
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