Characterization of interface states at Ni/nCdF2 Schottky barrier type diodes and the effect of CdF2 surface preparation
- 31 March 1985
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 28 (3) , 223-232
- https://doi.org/10.1016/0038-1101(85)90002-4
Abstract
No abstract availableKeywords
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