Soft fails in microelectronic circuits due to proton-induced nuclear reactions in material surrounding the SEU-sensitive volume
- 1 April 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 40-41, 1300-1305
- https://doi.org/10.1016/0168-583x(89)90644-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Microdosimetric Analysis of Proton Induced Reactions in Silicon and Gallium ArsenideIEEE Transactions on Nuclear Science, 1984
- Charge-Deposition Spectra in Thin Slabs of Silicon Induced by Energetic ProtonsIEEE Transactions on Nuclear Science, 1983
- Alpha-particle-induced field and enhanced collection of carriersIEEE Electron Device Letters, 1982
- Microdosimetric Aspects of Proton-Induced Nuclear Reactions in Thin Layers of SiliconIEEE Transactions on Nuclear Science, 1982